• DocumentCode
    3610671
  • Title

    How Affine Arithmetic Helps Beat Uncertainties in Electrical Systems

  • Author

    Tongyu Ding ; Trinchero, Riccardo ; Manfredi, Paolo ; Stievano, Igor S. ; Canavero, Flavio G.

  • Author_Institution
    Dept. of Electron. & Telecommun., Politec. di Torino, Turin, Italy
  • Volume
    15
  • Issue
    4
  • fYear
    2015
  • Firstpage
    70
  • Lastpage
    79
  • Abstract
    The ever-increasing impact of uncertainties in electronic circuits and systems is requiring the development of robust design tools capable of taking this inherent variability into account. Due to the computational inefficiency of repeated design trials, there has been a growing demand for smart simulation tools that can inherently and effectively capture the results of parameter variations on the system responses. To improve product performance, improve yield and reduce design cost, it is particularly relevant for the designer to be able to estimate worst-case responses. Within this framework, the article addresses the worst-case simulation of lumped and distributed electrical circuits. The application of interval-based methods, like interval analysis, Taylor models and affine arithmetic, is discussed and compared. The article reviews in particular the application of the affine arithmetic to complex algebra and fundamental matrix operations for the numerical frequency-domain simulation. A comprehensive and unambiguous discussion appears in fact to be missing in the available literature. The affine arithmetic turns out to be accurate and more efficient than traditional solutions based on Monte Carlo analysis. A selection of relevant examples, ranging from linear lumped circuits to distributed transmission-line structures, is used to illustrate this technique.
  • Keywords
    Monte Carlo methods; affine transforms; analogue integrated circuits; frequency-domain analysis; lumped parameter networks; transmission lines; Monte Carlo analysis; Taylor models; affine arithmetic; complex algebra; computational inefficiency; distributed electrical circuits; distributed transmission-line structures; electrical system uncertainty; electronic circuits; interval analysis; interval-based methods; linear lumped circuits; lumped electrical circuits; numerical frequency-domain simulation; parameter variations; repeated design trials; robust design tools; smart simulation tools; worst-case responses; Arithmetic; Computational modeling; Design tools; Frequency-domain analysis; Integrated circuit modeling; Monte Carlo methods; Numberal models; Performance evaluation; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1531-636X
  • Type

    jour

  • DOI
    10.1109/MCAS.2015.2484198
  • Filename
    7330121