• DocumentCode
    3610788
  • Title

    Hybrid Nonlinear Modeling Using Adaptive Sampling

  • Author

    Barmuta, Pawel ; Avolio, Gustavo ; Ferranti, Francesco ; Lewandowski, Arkadiusz ; Knockaert, Luc ; Schreurs, Dominique M. M.-P

  • Author_Institution
    Dept. of Electron. & Inf. Technol., Warsaw Univ. of Technol., Warsaw, Poland
  • Volume
    63
  • Issue
    12
  • fYear
    2015
  • Firstpage
    4501
  • Lastpage
    4510
  • Abstract
    This paper proposes a direct method for the extraction of empirical-behavioral hybrid models using adaptive sampling. The empirical base is responsible for the functionality over a wide range of variables, especially in the extrapolation range. The behavioral part corrects the errors of the empirical part in the region of particular interest, thus, it improves the accuracy in the desired region. Employment of response surface methodology and adaptive sampling allows full automation of the hybrid model extraction and assures its compactness. We used this approach to build a hybrid model composed of a robust empirical model available in CAD tools and a Radial Basis Functions interpolation model with Gaussian basis function. We extracted the hybrid model from measurements of a 0.15 μm GaAs HEMT and compared it with the pure behavioral and pure empirical models. The hybrid model yields higher accuracy while maintaining extrapolation capabilities. Additionally, the extraction time of the hybrid model is relatively low. We also show that a good accuracy level can be achieved with a small number of measurements.
  • Keywords
    Gaussian processes; III-V semiconductors; electronic design automation; extrapolation; high electron mobility transistors; radial basis function networks; response surface methodology; sampling methods; semiconductor device models; CAD tools; GaAs HEMT; Gaussian basis function; adaptive sampling; empirical-behavioral hybrid models; extrapolation; hybrid model extraction; hybrid nonlinear modeling; radial basis functions interpolation model; response surface methodology; size 0.15 mum; Accuracy; Adaptation models; Design automation; Extrapolation; Optimization; Response surface methodology; Solid modeling; Active device modeling; adaptive sampling; behavioral modeling; experimental design; response surface;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2015.2495124
  • Filename
    7331324