DocumentCode
3610996
Title
Precise Fault Location in TDM-PON by Utilizing Chaotic Laser Subject to Optical Feedback
Author
Tong Zhao ; Hong Han ; Jianguo Zhang ; Xianglian Liu ; XiaoMing Chang ; Anbang Wang ; Yuncai Wang
Author_Institution
Key Lab. of Adv. Transducers & Intell. Control Syst., Taiyuan Univ. of Technol., Taiyuan, China
Volume
7
Issue
6
fYear
2015
Firstpage
1
Lastpage
9
Abstract
We propose a method with high spatial resolution to detect fiber faults in a time-division multiplexing passive optical network (TDM-PON). A semiconductor laser serving as the probe light source is subjected to self-feedback caused by reflection at fiber faults. The feedback will induce the laser to generate chaos. Autocorrelation of the output time series shows the external cavity signature and, therefore, indicates the distance between the laser and the fiber fault. Each branch is identified by the marker that is formed by the inserted fiber Bragg grating (FBG) providing the feedback in each branch, and the faulty branch can be distinguished by the marker that has disappeared. Our proof-of-concept experiment demonstrates the identification of the faulty branch and the location of the fault point in an optical network simultaneously. This is achieved with a 6-km feeder fiber and realizes the 8-mm spatial resolution.
Keywords
Bragg gratings; fault location; laser cavity resonators; laser feedback; passive optical networks; semiconductor lasers; time division multiplexing; TDM-PON; chaotic laser; distance 6 km; external cavity signature; fiber Bragg grating; high spatial resolution; optical feedback; output time series; precise fault location; self-feedback; semiconductor laser; time-division multiplexing passive optical network; Bragg gratings; Chaos; Monitoring; Optical feedback; Optical network units; Chaotic laser; Fault location; Optical feedback; TDM-PON; Time-division multiplexed-passive optical network (TDM-PON); chaotic laser; fault location; optical feedback;
fLanguage
English
Journal_Title
Photonics Journal, IEEE
Publisher
ieee
ISSN
1943-0655
Type
jour
DOI
10.1109/JPHOT.2015.2502258
Filename
7332235
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