• DocumentCode
    3611287
  • Title

    Traceable measurements of electrical impedance

  • Author

    Callegaro, Luca

  • Author_Institution
    Ist. Naz. di Ricerca Metrol., INRIM, Turin, Italy
  • Volume
    18
  • Issue
    6
  • fYear
    2015
  • fDate
    12/1/2015 12:00:00 AM
  • Firstpage
    42
  • Lastpage
    46
  • Abstract
    Scientists and engineers from different backgrounds share the need for measurement of electrical impedance and related quantities. Equivalent lumped resistance, capacitance, or inductance are common parameters in the characterization, specification, and design of electrical and electronic components. Electric and magnetic material properties such as resistivity, permittivity, and permeability are derived from impedance and from geometrical measurements. Many sensors of physical quantities have impedance as their output quantity. The basis of electrochemical impedance spectroscopy (EIS) and electrical impedance tomography (EIT) is impedance measurement. As in all measurements, the basis of accurate impedance measurements is: ·a proper definition of the measurand; and · a traceability to the impedance units of the International System (SI), achieved through the use of calibrated impedance meters and impedance standards.
  • Keywords
    calibration; capacitance; electric impedance imaging; electric impedance measurement; electric sensing devices; electrochemical impedance spectroscopy; inductance; units (measurement); EIS; EIT; International System; SI unit; capacitance; electrical component; electrical impedance measurement; electrical impedance tomography; electrochemical impedance spectroscopy; electronic component; equivalent lumped resistance; geometrical measurement; impedance meter calibration; impedance standard; impedance unit traceability; inductance; sensor; Bridge circuits; Current measurement; Frequency measurement; Impedance; Impedance measurement; Standards; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2015.7335839
  • Filename
    7335839