Near-field measurement of stochastic electromagnetic fields

Author

Russer, Johannes A. ; Uddin, Nasir ; Awny, Ahmed Sanaa ; Thiede, Andreas ; Russer, Peter

Author_Institution

Inst. for Nanoelectron., Tech. Univ. Munchen, Munich, Germany

Volume

4

Issue

3

fYear

2015

Firstpage

79

Lastpage

85

Abstract

Stochastic electromagnetic fields with Gaussian amplitude probability distribution can be fully described by auto- and cross correlation spectra of the field components. The cross correlation spectra have to be known for the pairs of field components taken at different spatial points. Integrated electric dipole and magnetic loop probes together with active electronics in AlGaAs/GaAs-HEMT and SiGe:C-HBT technologies are presented. While the probes allow for a spatial resolution in the 100 μm range, integrated amplifiers provide about 30 dB gain over a bandwidth of about 10 GHz.

Keywords

Gaussian distribution; electromagnetic fields; stochastic processes; Gaussian amplitude probability distribution; cross correlation spectra; integrated electric dipole; magnetic loop probes; near-field measurement; stochastic electromagnetic fields; Electromagnetic fields; Electromagnetic interference; Integrated circuit modeling; Magnetic field measurement; Near-field radiation; Stochastic processes;

fLanguage

English

Journal_Title

Electromagnetic Compatibility Magazine, IEEE

Publisher

ieee

ISSN

2162-2264

Type

jour

DOI

10.1109/MEMC.2015.7336761

Filename

7336761