Modeling TID Effects in Mach-Zehnder Interferometer Silicon Modulator for HL-LHC Data Transmission Applications

Author

Seif El Nasr-Storey, Sarah ; Boeuf, Frederic ; Baudot, Charles ; Detraz, Stephane ; Fedeli, Jean Marc ; Marris-Morini, Delphine ; Olantera, Lauri ; Pezzullo, Giuseppe ; Sigaud, Christophe ; Soos, Csaba ; Troska, Jan ; Vasey, Francois ; Vivien, Laurent ; Z

Author_Institution

ST Microelectron., Grenoble, France

Volume

62

Issue

6

fYear

2015

Firstpage

2971

Lastpage

2978

Abstract

High-speed Mach-Zehnder interferometer silicon modulators were exposed to a total ionizing dose of 1.3 MGy, levels comparable to the worst radiation levels for a tracking detector after 10 years of operation at the High-Luminosity LHC, show a sensitivity to ionizing radiation after exposure to a dose of a few hundred kGy. A physical model to describe the effect of ionizing radiation on the modulators has been developed and is used to predict whether a more radiation-hard modulator can be designed to survive the harshest radiation environments expected at the HL-LHC.

Keywords

Mach-Zehnder interferometers; data communication; integrated optics; optical modulation; radiation hardening (electronics); silicon; HL-LHC data transmission applications; Mach-Zehnder interferometer silicon modulator; TID Effects; ionizing radiation sensitivity; radiation level; tracking detector; Ionizing radiation; Large Hadron Collider; Mach-Zehnder interferometers; Modulation; Radiation effects; Semiconductor process modeling; Silicon photonics; Silicon-on-insulator; Numerical simulations; radiation hardening; silicon photonics; silicon-on-insulator;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2015.2499041

Filename

7347455