• DocumentCode
    3611847
  • Title

    Microchannel Plate Detector Detection Efficiency to Monoenergetic Electrons Between 0.4 and 2.6 MeV

  • Author

    Blase, Ryan C. ; Benke, Roland R. ; Cooke, Chathan M. ; Pickens, Keith S.

  • Author_Institution
    Space Sci. & Eng. Div., Southwest Res. Inst., San Antonio, TX, USA
  • Volume
    62
  • Issue
    6
  • fYear
    2015
  • Firstpage
    3339
  • Lastpage
    3345
  • Abstract
    An unshielded microchannel plate detector was irradiated by an electron beam to determine the detection efficiency of electrons to create a detector signal or counts. Tested electron energies spanned a range of 400 kiloelectron volts to 2.6 million electron volts (MeV). Detection efficiency was found to decrease as the electron energy increased and ranged between 0.18 and 0.05 counts per incident electron, at 0.4 and 2.6 MeV, respectively. Simulations of beam losses over the experimental geometry were performed with MCNP6, and found to be similar in magnitude and possess a similar dependence over incident electron energy as the experimentally determined beam loss from beam current measurements. Detection efficiency as a function of incident angle of the electrons was also tested and relatively insignificant changes were observed. For the three beam energies and angles tested, deviation of the measured detection efficiency was 16%-22% (basically within the overlapping error bars of each measurement).
  • Keywords
    electron detection; microchannel plates; position sensitive particle detectors; MCNP6; beam angles; beam current measurements; beam losses; detector counts; detector signal; electron volt energy 0.4 MeV to 2.6 MeV; error bars; experimental geometry; incident electron energy; monoenergetic electrons; unshielded microchannel plate detector detection efficiency; Detectors; Electron beam applications; Noise measurement; Radiation effects; Space radiation; Detectors; electron beams; noise measurement; radiation transport modeling; space radiation effects;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2015.2488481
  • Filename
    7348740