DocumentCode
3611898
Title
Software Resilience and the Effectiveness of Software Mitigation in Microcontrollers
Author
Quinn, Heather ; Baker, Zachary ; Fairbanks, Tom ; Tripp, Justin L. ; Duran, George
Author_Institution
Los Alamos Nat. Lab., Los Alamos, NM, USA
Volume
62
Issue
6
fYear
2015
Firstpage
2532
Lastpage
2538
Abstract
Commercially available microprocessors could be useful to the space community for noncritical computations. There are many possible components that are smaller, lower-power, and less expensive than traditional radiation-hardened microprocessors. Many commercial microprocessors have issues with single-event effects (SEEs), such as single-event upsets (SEUs) and single-event transients (SETs), that can cause the microprocessor to calculate an incorrect result or crash. In this paper we present the Trikaya technique for masking SEUs and SETs through software mitigation techniques. Test results show that this technique can be very effective at masking errors, making it possible to fly these microprocessors for a variety of missions.
Keywords
electronic engineering computing; fault diagnosis; microcontrollers; software fault tolerance; SEE; SET; SEU; Trikaya technique; errors masking; microcontrollers; noncritical computations; radiation-hardened microprocessors; single-event effects; single-event transients; single-event upsets; soft errors; software fault diagnosis; software fault tolerance; software mitigation techniques; software resilience; space community; Fault diagnosis; Fault tolerance; Microprocessors; Single event transients; Single event upsets; Software; Soft errors; software; software fault diagnosis; software fault tolerance;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2015.2496342
Filename
7348804
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