• DocumentCode
    3611898
  • Title

    Software Resilience and the Effectiveness of Software Mitigation in Microcontrollers

  • Author

    Quinn, Heather ; Baker, Zachary ; Fairbanks, Tom ; Tripp, Justin L. ; Duran, George

  • Author_Institution
    Los Alamos Nat. Lab., Los Alamos, NM, USA
  • Volume
    62
  • Issue
    6
  • fYear
    2015
  • Firstpage
    2532
  • Lastpage
    2538
  • Abstract
    Commercially available microprocessors could be useful to the space community for noncritical computations. There are many possible components that are smaller, lower-power, and less expensive than traditional radiation-hardened microprocessors. Many commercial microprocessors have issues with single-event effects (SEEs), such as single-event upsets (SEUs) and single-event transients (SETs), that can cause the microprocessor to calculate an incorrect result or crash. In this paper we present the Trikaya technique for masking SEUs and SETs through software mitigation techniques. Test results show that this technique can be very effective at masking errors, making it possible to fly these microprocessors for a variety of missions.
  • Keywords
    electronic engineering computing; fault diagnosis; microcontrollers; software fault tolerance; SEE; SET; SEU; Trikaya technique; errors masking; microcontrollers; noncritical computations; radiation-hardened microprocessors; single-event effects; single-event transients; single-event upsets; soft errors; software fault diagnosis; software fault tolerance; software mitigation techniques; software resilience; space community; Fault diagnosis; Fault tolerance; Microprocessors; Single event transients; Single event upsets; Software; Soft errors; software; software fault diagnosis; software fault tolerance;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2015.2496342
  • Filename
    7348804