DocumentCode :
3611905
Title :
The Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
Author :
Gordon, Michael S. ; Rodbell, Kenneth P. ; Murray, Conal E. ; Sri-Jayantha, Sri M. ; McNally, Brendan D.
Author_Institution :
IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
62
Issue :
6
fYear :
2015
Firstpage :
3020
Lastpage :
3026
Abstract :
Electrically-insulating samples placed on the grounded sample tray in ionization detectors perturb the electric field within the detector. The resulting alpha particle emissivity of the samples is reduced depending on the magnitude and polarity of the surface voltage. Data are shown for samples with positive and negative surface charge, as well as methods to both measure and eliminate the effects of the surface charge.
Keywords :
electric field effects; particle detectors; electric field; electrically-insulating samples; grounded sample tray; ionization detectors; static charge; surface charge effects; surface voltage; ultralow alpha particle emissivity measurements; Alpha particles; Dielectrics; Ionization; Surface charging; Alpha particles; dielectric; electrical insulator; ionization detectors; low background; surface charge;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2015.2488983
Filename :
7348811
Link To Document :
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