• DocumentCode
    3612710
  • Title

    Recurrence quantification analysis as a novel LC feature extraction technique for the classification of pollution severity on HV insulator model

  • Author

    Chaou, A.K. ; Mekhaldi, A. ; Teguar, M.

  • Author_Institution
    Lab. de Rech. en Electrotech., Ecole Nat. Polytech. d´Alger, Algiers, Algeria
  • Volume
    22
  • Issue
    6
  • fYear
    2015
  • fDate
    12/1/2015 12:00:00 AM
  • Firstpage
    3376
  • Lastpage
    3384
  • Abstract
    Recently, Recurrent Plot (RP) was introduced to study Leakage Current (LC) for polluted insulator performance monitoring. Based on complex graphical representations, RP only provides a qualitative overview of the insulator state. To overcome this issue, we present in this paper a novel technique, named Recurrence Quantification Analysis (RQA) able not only to indicate RP structures, but also to quantify LC dynamics during the contamination process. RQA is introduced to investigate RP structures, quantify LC dynamics and extract features from LC waveforms for polluted insulator monitoring and performance diagnostic. For this purpose, LC acquisition is firstly carried out on a plan insulator model uniformly polluted with saline solution. Eight RQA indicators are presented to investigate LC waveforms under various pollution conductivities. Finally, mean values of RQA indicators are proposed as input for three well-known classification methods (K-Nearest Neighbors, Naïve Bayes and Support Vector Machines) in order to classify the contamination severity into five classes. Results show excellent correlation between RQA indicators and the pollution severity level.
  • Keywords
    Bayes methods; feature extraction; graph theory; insulator contamination; leakage currents; support vector machines; HV insulator model; K-nearest neighbors; LC feature extraction technique; Naïve Bayes; RQA; graphical representations; leakage current; polluted insulator performance monitoring; pollution severity classification; recurrence quantification analysis; recurrent plot; support vector machines; Conductivity; Contamination; Feature extraction; Insulators; Mathematical model; Monitoring; Pollution; Leakage current; classification methods; feature extraction; polluted insulator monitoring; recurrence quantification analysis; recurrent plot;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2015.004921
  • Filename
    7367534