• DocumentCode
    3612873
  • Title

    Design Flow and Characterization Methodology for Dual Mode Logic

  • Author

    Yuzhaninov, Viacheslav ; Levi, Itamar ; Fish, Alexander

  • Author_Institution
    Emerging Nanoscale Integrated Circuits & Syst. Labs., Bar-Ilan Univ., Ramat Gan, Israel
  • Volume
    3
  • fYear
    2015
  • fDate
    7/7/1905 12:00:00 AM
  • Firstpage
    3089
  • Lastpage
    3101
  • Abstract
    Recently, the dual mode logic (DML) family was introduced as a superior energy-delay alternative to CMOS. DML gates utilize two different modes of operation, dynamic and static, to selectively achieve either high-performance or low-energy operation. Custom designs of DML circuits have been shown to be very efficient. However, implementing DML circuits using the standard design flow and Electronic Design Automation (EDA) tools is very challenging, since DML gates operate in two different modes, each with its own characteristics and operating mechanisms. This paper shows, for the first time, that DML logic can be compatible with the standard design flow and optimized by various tools, such as synthesis and physical design. A DML cell library characterization methodology is also proposed to support the design flow. The methodology and flow were verified on a wide variety of benchmark designs with different gate counts and logic depths, and show that DML design is efficient under the standard design flow restrictions.
  • Keywords
    electronic design automation; logic circuits; logic design; logic gates; CMOS technology; DML cell library characterization methodology; DML circuit; DML gate; EDA tool; dual mode logic circuit; electronic design automation tool; energy-delay; standard design flow restriction; CMOS integrated circuits; Libraries; Logic gates; Robustness; Standards; Timing; Transistors; Dual Mode Logic (DML); Dynamic logic; Standard design flow; alternative logic family; dual mode logic (DML); dynamic logic;
  • fLanguage
    English
  • Journal_Title
    Access, IEEE
  • Publisher
    ieee
  • ISSN
    2169-3536
  • Type

    jour

  • DOI
    10.1109/ACCESS.2016.2514398
  • Filename
    7370913