DocumentCode :
3613792
Title :
Thermal resistance measurements of microwave devices
Author :
K. Gorecki;W.J. Stepowicz;J. Chramiec;J. Zarebski
Author_Institution :
Dept. of Marine Radioelectronics, Gdynia Maritime Acad., Poland
Volume :
2
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
383
Abstract :
Temperature influences strongly the electrical behaviour of semiconductor devices, affecting their d.c. characteristics as well as small and large-signal parameters. To determine the junction temperature under thermal steady-state conditions, its thermal resistance has to be known. This paper describes briefly the experimental set-up and procedures developed at the GMA which permit such characterisation of various semiconductor devices including microwave types. As shown in the experimental example, high sensitivity and accuracy of the presented method enables comparative measurements, yielding the thermal resistance value of microwave planar mounting structures.
Keywords :
"Thermal resistance","Electrical resistance measurement","Microwave measurements","Microwave devices","Electromagnetic heating","Electric resistance","Temperature sensors","Heat transfer","MOSFETs","Semiconductor devices"
Publisher :
ieee
Conference_Titel :
Microwaves, Radar and Wireless Communications, 2002. MIKON-2002. 14th International Conference on
Print_ISBN :
83-906662-5-1
Type :
conf
DOI :
10.1109/MIKON.2002.1017871
Filename :
1017871
Link To Document :
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