• DocumentCode
    3614143
  • Title

    Photoenhanced wet etching of gallium nitride on submicrometer scale

  • Author

    J. Skriniarova;A. van der Hart;H.P. Bochem;A. Fox;P. Kordos

  • Author_Institution
    Dept. of Microelectron., Slovak Univ. of Technol., Bratislava, Slovakia
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    283
  • Lastpage
    285
  • Abstract
    Photoassisted electrochemical (PEC) etching of n-doped GaN layer grown on sapphire in the KOH based solution under illumination by a mercury-xenon-arc lamp is demonstrated. Smooth surfaces were obtained for a narrow range of etching conditions. It was found that this range could be extended by using etch conditions which produced "whiskers". Subsequent post treatment in developer AZ 400K and KOH solution were used to remove these whiskers and reduced fibrous texture of the grooves walls. This can provide a smooth sidewall on the PEC etched surface. As a result of optimized PEC process 500 nm wide grooves in GaN were successfully obtained.
  • Keywords
    "Wet etching","III-V semiconductor materials","Gallium nitride","Surface morphology","Lighting","Scanning electron microscopy","Cathodes","Microelectronics","Transistors","Lamps"
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Devices and Microsystems, 2002. The Fourth International Conference on
  • Print_ISBN
    0-7803-7276-X
  • Type

    conf

  • DOI
    10.1109/ASDAM.2002.1088525
  • Filename
    1088525