DocumentCode :
3614143
Title :
Photoenhanced wet etching of gallium nitride on submicrometer scale
Author :
J. Skriniarova;A. van der Hart;H.P. Bochem;A. Fox;P. Kordos
Author_Institution :
Dept. of Microelectron., Slovak Univ. of Technol., Bratislava, Slovakia
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
283
Lastpage :
285
Abstract :
Photoassisted electrochemical (PEC) etching of n-doped GaN layer grown on sapphire in the KOH based solution under illumination by a mercury-xenon-arc lamp is demonstrated. Smooth surfaces were obtained for a narrow range of etching conditions. It was found that this range could be extended by using etch conditions which produced "whiskers". Subsequent post treatment in developer AZ 400K and KOH solution were used to remove these whiskers and reduced fibrous texture of the grooves walls. This can provide a smooth sidewall on the PEC etched surface. As a result of optimized PEC process 500 nm wide grooves in GaN were successfully obtained.
Keywords :
"Wet etching","III-V semiconductor materials","Gallium nitride","Surface morphology","Lighting","Scanning electron microscopy","Cathodes","Microelectronics","Transistors","Lamps"
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 2002. The Fourth International Conference on
Print_ISBN :
0-7803-7276-X
Type :
conf
DOI :
10.1109/ASDAM.2002.1088525
Filename :
1088525
Link To Document :
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