DocumentCode :
3614153
Title :
Combining dual-supply, dual-threshold and transistor sizing for power reduction
Author :
S. Augsburger;B. Nikolic
Author_Institution :
Enterprise Processors Div., Intel Corp., Santa Clara, CA, USA
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
316
Lastpage :
321
Abstract :
Multiple supply voltages, multiple transistor thresholds and transistor sizing could be used to reduce the power dissipation of digital blocks. This paper presents a framework for evaluating the effectiveness of each of these approaches independently and in conjunction with each other. Results show the advantages of multiple supply, transistor sizing, and multiple threshold can be compounded to maximize power reduction. The order of application of these techniques determines the final savings in active and leakage power.
Keywords :
"Threshold voltage","Energy consumption","Power dissipation","Leakage current","Delay","Very large scale integration","Throughput","Dynamic voltage scaling","CMOS technology","Power generation"
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2002. Proceedings. 2002 IEEE International Conference on
ISSN :
1063-6404
Print_ISBN :
0-7695-1700-5
Type :
conf
DOI :
10.1109/ICCD.2002.1106788
Filename :
1106788
Link To Document :
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