DocumentCode :
3614233
Title :
Process visualization with levels of detail
Author :
K. Matkovic;H. Hauser;R. Sainitzer;M.E. Groller
Author_Institution :
VRVis Res. Center, Vienna, Austria
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
67
Lastpage :
70
Abstract :
We demonstrate how we apply information visualization techniques to process monitoring. Virtual instruments are enhanced using history encoding instruments are capable of displaying the current value and the value from the near past. Multi-instruments are capable of displaying several data sources simultaneously. Levels of detail for virtual instruments are introduced where the screen area is inversely proportional to the information amount displayed. Furthermore the monitoring system is enhanced by using: 3D anchoring attachment of instruments to positions on a 3D model, collision avoidance a physically based spring model prevents instruments from overlapping, and focus+context rendering - giving the user a possibility to examine particular instruments in detail without loosing the context information.
Keywords :
"Visualization","Instruments","History","Encoding","Computerized monitoring","Light emitting diodes","Displays","Context modeling","Collision avoidance","Needles"
Publisher :
ieee
Conference_Titel :
Information Visualization, 2002. INFOVIS 2002. IEEE Symposium on
ISSN :
1522-404X
Print_ISBN :
0-7695-1751-X
Type :
conf
DOI :
10.1109/INFVIS.2002.1173149
Filename :
1173149
Link To Document :
بازگشت