DocumentCode :
3614321
Title :
Ultra-low constant-current generation with MOS interface-trap charge pump
Author :
U. Cilingiroglu;K.T. Veeder;A. Becker-Gomez
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Volume :
1
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Lastpage :
275
Abstract :
We explore the MOS interface-trap charge-pump (ITCP) as an ultra-low constant-current generator for analog CMOS applications. Switched-capacitor (SC) techniques are generally suitable for ultra-low current generation because the current can be linearly controlled by frequency regardless of the level of current. ITCP has the same property but the minimum charge it puts out per cycle is at least two orders of magnitude smaller than that of an SC core. This helps generate the same current more accurately at a much higher frequency with a much smaller filter capacitance. The paper presents an optimized current generator configuration of rail-to-rail output range, zero temperature coefficient and very high output resistance. Transconductor circuits built with the charge pump are presented and experimentally evaluated.
Keywords :
"Charge pumps","Voltage","MOSFET circuits","Frequency","Clocks","Costs","Electron mobility","Filters","Capacitance","Variable structure systems"
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
Type :
conf
DOI :
10.1109/MWSCAS.2002.1187210
Filename :
1187210
Link To Document :
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