DocumentCode
3614957
Title
High-speed lateral polysilicon photodiode in standard CMOS technology
Author
S. Radovanovic;A.J. Annoma;B. Nauta
Author_Institution
MESA Res. Inst., Twente Univ., Enschede, Netherlands
fYear
2003
fDate
6/25/1905 12:00:00 AM
Firstpage
521
Lastpage
524
Abstract
A high-performance lateral polysilicon photodiode was designed in standard 0.18 /spl mu/m CMOS technology. The device has a frequency bandwidth far in the GHz range: the measured bandwidth of the poly photodiode was 6 GHz, which figure was limited by the measurement equipment. The high intrinsic (physical) bandwidth is due to a short excess carrier lifetime. The external (electrical) bandwidth is also high because of a very small parasitic capacitance (< 0.1 pF). This is the best bandwidth performance among all reported diodes designed in a standard CMOS. The quantum efficiency of this poly photodiode is 0.2% due to the very small light sensitive diode volume. The diode active area is limited by a narrow depletion region and its depth by the technology.
Keywords
"CMOS technology","Photodiodes","Diodes","Bandwidth","Optical fiber communication","Optical receivers","Doping","Frequency","Optical fiber devices","MOSFETs"
Publisher
ieee
Conference_Titel
European Solid-State Device Research, 2003. ESSDERC ´03. 33rd Conference on
Print_ISBN
0-7803-7999-3
Type
conf
DOI
10.1109/ESSDERC.2003.1256928
Filename
1256928
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