DocumentCode
3614984
Title
1/f noise versus magnetic field in RuO/sub 2/ based thick film resistors
Author
P. Ptak;A. Kolek;Z. Zawislak;K. Mleczko;A.W. Stadler
Author_Institution
Dept. of Electron. Fundamentals, Rzeszow Univ. of Technol., Poland
fYear
2003
fDate
6/25/1905 12:00:00 AM
Firstpage
196
Lastpage
201
Abstract
Low frequency noise has been measured in RuO/sub 2/+ glass thick film resistors in subkelvin temperatures and in magnetic fields. Samples were fabricated from laboratory-made pastes, which did not contain any modifiers (only RuO/sub 2/ and glass of known volume fractions). Measurements performed with ac technique show that below 4 K relative noise intensity increases significantly and becomes a factor limiting the resolution of RuO/sub 2/ temperature sensors. Magnetic field does not influence this resolution.
Keywords
"Magnetic noise","Magnetic fields","Magnetic field measurement","Low-frequency noise","Noise measurement","Glass","Frequency measurement","Thickness measurement","Thick films","Resistors"
Publisher
ieee
Conference_Titel
Electronics Technology: Integrated Management of Electronic Materials Production, 2003. 26th International Spring Seminar on
Print_ISBN
0-7803-8002-9
Type
conf
DOI
10.1109/ISSE.2003.1260515
Filename
1260515
Link To Document