DocumentCode
3615096
Title
DF for low cost testers [Tutorial]
Author
D. Gizopoulos;G. Eide;A. Crouch;K. Posse
Author_Institution
Pireaus U.
Volume
1
fYear
2004
fDate
6/26/1905 12:00:00 AM
Keywords
"Tutorial","Costs","Design for testability","Design engineering","Knowledge engineering","Integrated circuit testing","Formal verification","Design automation","Synchronization","Test equipment"
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1268806
Filename
1268806
Link To Document