DocumentCode
3615221
Title
Very thin layers prepared by laser ablation from Bi/sub 2/Te/sub 3/ target
Author
R. Zeipl;S. Karamazov;M. Jelinek;P. Lostak;M. Pavelka;S. Winiarz;R. Czajka;J. Vanis;F. Sroubek;J. Zelinka;J. Walachova
Author_Institution
Inst. of Radio Eng. & Electron., Acad. of Sci. of the Czech Republic, Prague, Czech Republic
fYear
2003
fDate
6/25/1905 12:00:00 AM
Firstpage
342
Lastpage
345
Abstract
Transport properties are presented for 60nm thick layers which were prepared by the laser ablation from a Bi/sub 2/Te/sub 3/ target. The layers are deposited on quartz glass substrates. The energy density of the laser beam I on the target is 2Jcm/sup -2/ and the temperature of the substrate during deposition varies between (200-480/spl deg/C) for different samples. The influence of the temperature of the substrate during the deposition on topography of layers measured by Scanning Tunnelling Microscope (STM) is presented. The BiTe and Bi/sub 2/Te phases are detected by the X-ray Diffraction (XRD) method.
Keywords
"Laser ablation","Bismuth","Tellurium","Temperature","Glass","Laser beams","Surfaces","Tunneling","Microscopy","Phase detection"
Publisher
ieee
Conference_Titel
Thermoelectrics, 2003 Twenty-Second International Conference on - ICT
Print_ISBN
0-7803-8301-X
Type
conf
DOI
10.1109/ICT.2003.1287518
Filename
1287518
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