Title :
A Bayesian approach to sensor characterization
Author_Institution :
NASA Ames Res. Center, Moffett Field, CA, USA
fDate :
6/25/1905 12:00:00 AM
Abstract :
The physical model of a generic electro-optic sensor is derived and incorporated into a Bayesian framework for the estimation of key instrument parameters from calibration data. The sensor characterization thus achieved enables optimal subsequent removal of instrument effects from field data, leading to the highest possible accuracy in the retrieved physical quantities.
Keywords :
"Bayesian methods","Sensor phenomena and characterization","Calibration","Instruments","Data analysis","Electrooptic devices","NASA","Postal services","Information retrieval","Signal processing"
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2003. IGARSS ´03. Proceedings. 2003 IEEE International
Print_ISBN :
0-7803-7929-2
DOI :
10.1109/IGARSS.2003.1295266
