DocumentCode
3615396
Title
When digital becomes analog - Interfaces in high speed test
Author
W. Maichen
Author_Institution
Teradyne
fYear
2004
fDate
6/26/1905 12:00:00 AM
Keywords
"Data engineering","Design engineering","Clocks","Frequency","Transmission line theory","System performance","System testing","Signal design","Probes"
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
ISSN
1093-0167
Print_ISBN
0-7695-2134-7
Type
conf
DOI
10.1109/VTEST.2004.1299212
Filename
1299212
Link To Document