• DocumentCode
    3615398
  • Title

    Memory test and self-test for deep sub-micron technologies

  • Author

    D. Adams

  • Author_Institution
    Magma-DA
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Keywords
    "Automatic testing","Built-in self-test","Design engineering","Redundancy","Product design","Technology management","Engineering management","Memory management","Cams","Nonvolatile memory"
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2134-7
  • Type

    conf

  • DOI
    10.1109/VTEST.2004.1299214
  • Filename
    1299214
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3615398