• DocumentCode
    3615399
  • Title

    Statistical methods for VLSI test, quality and reliability

  • Author

    A. Singh

  • Author_Institution
    Auburn University
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Keywords
    "Statistical analysis","Very large scale integration","Circuit testing","Reliability engineering","Design engineering","Engineering management","Statistical distributions","Manufacturing","Delay effects","Optimization methods"
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2004. Proceedings. 22nd IEEE
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2134-7
  • Type

    conf

  • DOI
    10.1109/VTEST.2004.1299215
  • Filename
    1299215
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3615399