• DocumentCode
    3615493
  • Title

    Numerical simulation and experimental verification of the thermal contact properties of the polymers bonds

  • Author

    A. Wymyslowski;T. Falat;K. Friedel;J. Felba

  • Author_Institution
    Fac. of Microsystem Electron. & Photonics, Wroclaw Univ. of Technol., Poland
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Firstpage
    177
  • Lastpage
    183
  • Abstract
    The important "bottleneck" of heat dissipation in electronic packages may be due to the thermal contact resistance (TCR). The high thermal contact resistance reduces the amount of heat which can be transmitted from the heat source to the heat sink and the same raises the device temperature and reduces the overall reliability of the package due to thermo-mechanical stresses. Most often the thermal contact properties are not known and some assumptions have to be made in order to simulate the temperature distribution over electronic packages with thermal contacts. The lack of knowledge of precise thermal conductivity properties of most electronic packaging materials (adhesives, polymers, etc.) is a basic problem in the numerical simulation of temperature distribution in modem electronic packages. This is especially true in the case of polymer materials, with the growing demand on diminishing the size of microelectronic packages and increasing heat consumption in a unit area. The current paper is focused on assessment of the polymer layer and polymer thermal contact conductivity properties through an experimental setup and the follow up application of the results to numerical simulation.
  • Keywords
    "Numerical simulation","Polymers","Electronic packaging thermal management","Resistance heating","Thermal conductivity","Heat sinks","Thermal resistance","Contact resistance","Thermal stresses","Temperature distribution"
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on
  • Print_ISBN
    0-7803-8420-2
  • Type

    conf

  • DOI
    10.1109/ESIME.2004.1304038
  • Filename
    1304038