DocumentCode :
3615602
Title :
Adsorbed mass and resonant frequency fluctuations of a microcantilever caused by adsorption and desorption of particles of two gases
Author :
Z. Djuric;L. Jokic;M. Frantlovic;O. Jaksic;D. Vasiljevic-Radovic
Author_Institution :
Dept. of Microelectron. Technol. & Single Crystals, Inst. of Chem., Technol. & Metall., Belgrade, Serbia
Volume :
1
fYear :
2004
fDate :
6/26/1905 12:00:00 AM
Firstpage :
197
Abstract :
Microcantilever resonant frequency and mass fluctuation caused by adsorption and desorption of surrounding particles in a two-gas atmosphere are considered. Detailed derivations of mass fluctuation power spectral density and frequency fluctuation power spectral density are performed using analytical approach. The analogy between Shockley-Read generation-recombination processes of electrons in solids and adsorption-desorption processes of particles of a two gas atmosphere around the cantilever is shown. Simulation is given for a silicon microcantilever surrounded by nitrogen and hydrogen.
Keywords :
"Resonant frequency","Fluctuations","Gases","Atmosphere","Performance analysis","Electrons","Solids","Atmospheric modeling","Silicon","Nitrogen"
Publisher :
ieee
Conference_Titel :
Microelectronics, 2004. 24th International Conference on
Print_ISBN :
0-7803-8166-1
Type :
conf
DOI :
10.1109/ICMEL.2004.1314592
Filename :
1314592
Link To Document :
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