• DocumentCode
    3616259
  • Title

    Millimeter wave material homogeneity mapping technique

  • Author

    A. Laurinavicius;T. Anbinderis;Yu. Prishutov;O. Martianova;B. Gorbatenko;C. Kuch

  • Author_Institution
    Semicond. Phys. Inst., Vilnius, Lithuania
  • Volume
    2
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Firstpage
    806
  • Abstract
    In this paper we present a millimeter wave homogeneity mapping technique useable for very wide spectrum of large area materials, including dielectrics, semiconductors, metals and biological objects. A spatial resolution of this technique is 0.5 mm/sup 2/.
  • Keywords
    "Millimeter wave technology","Millimeter wave measurements","Dielectric substrates","Dielectric measurements","Testing","Probes","Dielectric materials","Bridges","Conductivity","Surface resistance"
  • Publisher
    ieee
  • Conference_Titel
    Physics and Engineering of Microwaves, Millimeter, and Submillimeter Waves, 2004. MSMW 04. The Fifth International Kharkov Symposium on
  • Print_ISBN
    0-7803-8411-3
  • Type

    conf

  • DOI
    10.1109/MSMW.2004.1346170
  • Filename
    1346170
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3616259