Title :
Millimeter wave material homogeneity mapping technique
Author :
A. Laurinavicius;T. Anbinderis;Yu. Prishutov;O. Martianova;B. Gorbatenko;C. Kuch
Author_Institution :
Semicond. Phys. Inst., Vilnius, Lithuania
fDate :
6/26/1905 12:00:00 AM
Abstract :
In this paper we present a millimeter wave homogeneity mapping technique useable for very wide spectrum of large area materials, including dielectrics, semiconductors, metals and biological objects. A spatial resolution of this technique is 0.5 mm/sup 2/.
Keywords :
"Millimeter wave technology","Millimeter wave measurements","Dielectric substrates","Dielectric measurements","Testing","Probes","Dielectric materials","Bridges","Conductivity","Surface resistance"
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter, and Submillimeter Waves, 2004. MSMW 04. The Fifth International Kharkov Symposium on
Print_ISBN :
0-7803-8411-3
DOI :
10.1109/MSMW.2004.1346170
