DocumentCode :
3616276
Title :
Lateral bipolar transistor´s extrinsic base design for better f/sub T/ vs BV/sub CEO/ solution
Author :
M. Koricic;P. Biljanovic;T. Suligoj
Author_Institution :
Fac. of Electr. Eng. & Comput., Zagreb Univ., Croatia
Volume :
1
fYear :
2004
fDate :
6/26/1905 12:00:00 AM
Firstpage :
39
Abstract :
In modern fast bipolar transistor design, high frequency performance and current operating level are traded off with breakdown voltages. Charge sharing between extrinsic and intrinsic base acceptors reduces the maximum electric field in the intrinsic transistor and improves BV/sub CEO/. Extrinsic base can be optimized and higher breakdown voltage can be obtained without severely degrading high frequency performance. This was shown by the simulation of the horizontal current bipolar transistor electrical characteristics.
Keywords :
"Bipolar transistors","Frequency","Current density","Degradation","Kirk field collapse effect","MOSFETs","Doping profiles","High performance computing","Electric breakdown","Circuits"
Publisher :
ieee
Conference_Titel :
Electrotechnical Conference, 2004. MELECON 2004. Proceedings of the 12th IEEE Mediterranean
Print_ISBN :
0-7803-8271-4
Type :
conf
DOI :
10.1109/MELCON.2004.1346766
Filename :
1346766
Link To Document :
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