• DocumentCode
    3617051
  • Title

    Overlapping variance estimators for simulations

  • Author

    C. Alexopoulos;D. Goldsman;N.T. Argon;G. Tokol

  • Author_Institution
    Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    1
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Lastpage
    745
  • Abstract
    We examine properties of overlapped versions of the standardized time series area and Cramer-von Mises estimators for the variance parameter of a stationary stochastic process, e.g., a steady-state simulation output process. We find that the overlapping estimators have the same bias properties as, but lower variance than, their nonoverlapping counterparts; the new estimators also perform well against the benchmark batch means estimator. We illustrate our findings with analytical and Monte Carlo examples.
  • Keywords
    "Sociotechnical systems","Modeling","Steady-state","Analysis of variance","Argon","Analytical models","Random variables","Systems engineering and theory","Industrial engineering","Stochastic processes"
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2004. Proceedings of the 2004 Winter
  • Print_ISBN
    0-7803-8786-4
  • Type

    conf

  • DOI
    10.1109/WSC.2004.1371384
  • Filename
    1371384