3617524

Signal integrity and reliability of integrated circuits: practical cons erations at 130nm and below [Tutorial 3]

K. Tseng;S.M. Alam

2004

6/26/1905 12:00:00 AM

"Tutorial","Integrated circuit reliability","Signal design","Crosstalk","Electromigration","Integrated circuit interconnections","Integrated circuit layout","Reliability engineering","Design engineering","Electronic design automation and methodology"

ieee

Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on

1092-3152

0-7803-8702-3

conf

10.1109/ICCAD.2004.1382525

1382525