DocumentCode :
3618028
Title :
Mean crystallite size, size distribution and root mean square residual microstrain measurement from X-ray line broadening of milled ZnSe nano-powders
Author :
R. Radoi;M. Danila;P. Fernandez;J. Piqueras
Author_Institution :
Nat. Inst. for Res. & Dev. in Microtechnol., Bucharest, Romania
Volume :
2
fYear :
2004
fDate :
6/26/1905 12:00:00 AM
Firstpage :
505
Abstract :
One of the simplest available ways of producing nano-structured materials (i.e., nano-powders) is the milling (grinding) technique. However, producing nano-powders with a crystallite size down to 10 nanometers is a very daunting task. In this application-oriented study, we have investigated the structural changes of commercially available ZnSe powders induced by the milling process. Those changes were revealed by the wide angle X-ray diffraction technique using the X-ray line broadening (´direct´, Stokes Fourier method, Hall-Williamson and Warren-Averbach method). We found that the initial powder had a crystallite size D/spl sim/90 nm (Scherrer equation) and a micro-strain /spl epsiv/=/spl Delta/d/d/spl sim/10/sup -5/. After 40 hours of grinding the ZnSe powder had a crystallite size D of 12-14 nm and /spl epsiv//spl sim/3.9 10/sup -3/.
Keywords :
"Crystallization","Root mean square","Size measurement","Zinc compounds","Powders","Nanostructured materials","Milling","Crystalline materials","X-ray diffraction","Equations"
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 2004. CAS 2004 Proceedings. 2004 International
Print_ISBN :
0-7803-8499-7
Type :
conf
DOI :
10.1109/SMICND.2004.1403061
Filename :
1403061
Link To Document :
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