Title :
Measurement-to-modeling correlation of the power delivery network impedance of a microprocessor system
Author :
K. Aygun;M.J. Hill;K.D. Ellert;K. Radhakrishnan
Author_Institution :
Intel Corp., Chandler, AZ, USA
fDate :
6/26/1905 12:00:00 AM
Abstract :
An automated system for measuring the power delivery impedance profile on a functional system is presented. The data collected by this system is used to assess the accuracy of a distributed power delivery system model.
Keywords :
"Impedance measurement","Power measurement","Microprocessors","Current measurement","Power system modeling","Frequency measurement","Voltage measurement","Phase measurement","Power system reliability","Power generation"
Conference_Titel :
Electrical Performance of Electronic Packaging, 2004. IEEE 13th Topical Meeting on
Print_ISBN :
0-7803-8667-1
DOI :
10.1109/EPEP.2004.1407592
