Title :
Phase-sensitive time-domain terahertz reflectometry
Author :
A. Pashkin;F. Kadlec;H. Nemec;P. Kuzel
Author_Institution :
Inst. of Phys., Acad. of Sci. of the Czech Republic, Prague, Czech Republic
fDate :
6/26/1905 12:00:00 AM
Abstract :
We review a recently developed method for measuring the terahertz reflectivity able to provide correctly both the amplitude and the phase of terahertz radiation reflected from the sample. Thus it is possible to evaluate the complex optical constants of opaque materials including crystals, ceramics and thin films.
Keywords :
"Time domain analysis","Reflectometry","Optical films","Submillimeter wave measurements","Phase measurement","Reflectivity","Crystalline materials","Optical materials","Crystals","Ceramics"
Conference_Titel :
Infrared and Millimeter Waves, 2004 and 12th International Conference on Terahertz Electronics, 2004. Conference Digest of the 2004 Joint 29th International Conference on
Print_ISBN :
0-7803-8490-3
DOI :
10.1109/ICIMW.2004.1422117
