• DocumentCode
    3618393
  • Title

    Dielectric lifetimeumited by statistics pre- and post-breakdown degradation

  • Author

    F. Monsieur

  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Firstpage
    197
  • Lastpage
    197
  • Keywords
    "Statistics","Degradation","Thin film transistors","Electric breakdown","Physics","Dielectric breakdown","Microelectronics","Integrated circuit interconnections","Voltage","Materials reliability"
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 2004 IEEE International
  • Print_ISBN
    0-7803-8517-9
  • Type

    conf

  • DOI
    10.1109/IRWS.2004.1422779
  • Filename
    1422779
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3618393