• DocumentCode
    3619044
  • Title

    Two-dimensional microstrip germanium detector for X-ray spectroscopy of highly charged heavy ions

  • Author

    D. Protic;T. Stohlker;T. Krings;I. Mohos;U. Spillmann

  • Author_Institution
    Forschungszentrum Julich GmbH, Germany
  • Volume
    2
  • fYear
    2004
  • fDate
    6/26/1905 12:00:00 AM
  • Firstpage
    941
  • Abstract
    New possibilities are opened utilizing position-sensitive germanium detectors in the X-ray spectroscopy of highly charged heavy ions at GSI-Darmstadt. The recent experiments revealed the need for two-dimensional strip detectors with their inherent advantages concerning spectroscopy and imaging capabilities as well as polarization sensitivity. For the first prototype a germanium diode (70 mm /spl times/ 41 mm, 11 mm thick) with a boron implanted contact and an amorphous Ge contact was prepared. A 128 strip structure on an area of 32 mm /spl times/ 56 mm with a pitch of 250 /spl mu/m on the front contact (implanted) and 48 strip structure with a pitch of 1167 /spl mu/m on the rear contact (amorphous Ge) are realized with the help of plasma etching. The detector is mounted in a cryostat which will enable any orientation of the detector in respect to a photon source. The results of laboratory tests and first applications at the ESR storage ring in Darmstadt are presented.
  • Keywords
    "Microstrip","Germanium","X-ray detection","X-ray detectors","Spectroscopy","Strips","X-ray imaging","Amorphous materials","Position sensitive particle detectors","Optical imaging"
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462361
  • Filename
    1462361