DocumentCode :
3619044
Title :
Two-dimensional microstrip germanium detector for X-ray spectroscopy of highly charged heavy ions
Author :
D. Protic;T. Stohlker;T. Krings;I. Mohos;U. Spillmann
Author_Institution :
Forschungszentrum Julich GmbH, Germany
Volume :
2
fYear :
2004
fDate :
6/26/1905 12:00:00 AM
Firstpage :
941
Abstract :
New possibilities are opened utilizing position-sensitive germanium detectors in the X-ray spectroscopy of highly charged heavy ions at GSI-Darmstadt. The recent experiments revealed the need for two-dimensional strip detectors with their inherent advantages concerning spectroscopy and imaging capabilities as well as polarization sensitivity. For the first prototype a germanium diode (70 mm /spl times/ 41 mm, 11 mm thick) with a boron implanted contact and an amorphous Ge contact was prepared. A 128 strip structure on an area of 32 mm /spl times/ 56 mm with a pitch of 250 /spl mu/m on the front contact (implanted) and 48 strip structure with a pitch of 1167 /spl mu/m on the rear contact (amorphous Ge) are realized with the help of plasma etching. The detector is mounted in a cryostat which will enable any orientation of the detector in respect to a photon source. The results of laboratory tests and first applications at the ESR storage ring in Darmstadt are presented.
Keywords :
"Microstrip","Germanium","X-ray detection","X-ray detectors","Spectroscopy","Strips","X-ray imaging","Amorphous materials","Position sensitive particle detectors","Optical imaging"
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8700-7
Type :
conf
DOI :
10.1109/NSSMIC.2004.1462361
Filename :
1462361
Link To Document :
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