3619264

Recursive learning: a new implication technique for efficient solutions to CAD problems-test, verification, and optimization

W. Kunz;D.K. Pradhan

2

2003

6/25/1905 12:00:00 AM

350

365

"Circuit testing","Logic testing","Circuit faults","Combinational circuits","Logic circuits","Logic design","Helium","Large Hadron Collider","DH-HEMTs","Digital circuits"

ieee

Circuits and Systems, 2003. Tutorial Guide: ISCAS 2003. The IEEE International Symposium on

0-7803-7991-8

conf

10.1109/TUTCAS.2003.1490927

1490927