• DocumentCode
    3619282
  • Title

    Chosen electrical and reliability properties of thick film photoimageable components

  • Author

    A. Pietrikova;S. Slosarcik;M. Bujalobokova;P. Cabuk;I. Vehec

  • Author_Institution
    Dept. of Technol. in Electron., Kosice Tech. Univ.
  • fYear
    2005
  • fDate
    6/27/1905 12:00:00 AM
  • Firstpage
    407
  • Lastpage
    412
  • Abstract
    This paper presents the correlation between electrical and reliability properties and processing conditions. Fodelreg photoimageable technology as an extension of traditional thick-film process providing a higher line resolution, has been considered in the field of unconventional application based on both 3D bent multilayers and thick film mono and multilayer inductors construction with a resolution about 150 mum. Common denominator of two different ideas is our experience with thick film photoimageable conductors and study of chosen electrical and reliability properties. The developed and adapted LTCC technology based on photoimageable technology has produced about 100 mum wide lines that are composed in shaped 3D bent multilayer structures. Chosen electrical properties of inductors based on photoimageable conductor has been evaluated including their ageing reliability test
  • Keywords
    "Thick films","Nonhomogeneous media","Thick film inductors","Conducting materials","Conductive films","Springs","Seminars","MONOS devices","Testing","Production"
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. 28th International Spring Seminar on
  • Print_ISBN
    0-7803-9325-2
  • Type

    conf

  • DOI
    10.1109/ISSE.2005.1491063
  • Filename
    1491063