DocumentCode :
3619282
Title :
Chosen electrical and reliability properties of thick film photoimageable components
Author :
A. Pietrikova;S. Slosarcik;M. Bujalobokova;P. Cabuk;I. Vehec
Author_Institution :
Dept. of Technol. in Electron., Kosice Tech. Univ.
fYear :
2005
fDate :
6/27/1905 12:00:00 AM
Firstpage :
407
Lastpage :
412
Abstract :
This paper presents the correlation between electrical and reliability properties and processing conditions. Fodelreg photoimageable technology as an extension of traditional thick-film process providing a higher line resolution, has been considered in the field of unconventional application based on both 3D bent multilayers and thick film mono and multilayer inductors construction with a resolution about 150 mum. Common denominator of two different ideas is our experience with thick film photoimageable conductors and study of chosen electrical and reliability properties. The developed and adapted LTCC technology based on photoimageable technology has produced about 100 mum wide lines that are composed in shaped 3D bent multilayer structures. Chosen electrical properties of inductors based on photoimageable conductor has been evaluated including their ageing reliability test
Keywords :
"Thick films","Nonhomogeneous media","Thick film inductors","Conducting materials","Conductive films","Springs","Seminars","MONOS devices","Testing","Production"
Publisher :
ieee
Conference_Titel :
Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. 28th International Spring Seminar on
Print_ISBN :
0-7803-9325-2
Type :
conf
DOI :
10.1109/ISSE.2005.1491063
Filename :
1491063
Link To Document :
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