• DocumentCode
    3619391
  • Title

    Modeling of transients caused by a laser attack on smart cards

  • Author

    D. Leroy;S.J. Piestrak;F. Monteiro;A. Dandache

  • Author_Institution
    iRoC Technol. SA, Grenoble, France
  • fYear
    2005
  • fDate
    6/27/1905 12:00:00 AM
  • Firstpage
    193
  • Lastpage
    194
  • Abstract
    Several techniques for extracting data from smart cards have been described in the literature, including the so called differential fault analysis (DFA) that relies on perturbing the chip operations to deduce the data. In this paper, we present some experimental results of the DFA that relies on using a laser beam.
  • Keywords
    "Laser modes","Smart cards","CMOS logic circuits","Doped fiber amplifiers","Laser beam cutting","Circuit testing","Circuit faults","Laser beams","Logic gates","Inverters"
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2005. IOLTS 2005. 11th IEEE International
  • Print_ISBN
    0-7695-2406-0
  • Type

    conf

  • DOI
    10.1109/IOLTS.2005.43
  • Filename
    1498155
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619391