• DocumentCode
    3619448
  • Title

    Rapid IC Performance Yield and distribution prediction using a rotation of the circuit parameter principals components

  • Author

    J. Horan;C. Lyden

  • Author_Institution
    Cork Regional Technical College, Ireland
  • fYear
    1997
  • fDate
    6/19/1905 12:00:00 AM
  • Firstpage
    648
  • Lastpage
    651
  • Keywords
    "Circuits","Costs","Sampling methods","Yield estimation","Ring oscillators","Educational institutions","Computational efficiency","Computational modeling","Analysis of variance","Principal component analysis"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194512
  • Filename
    1503442