• DocumentCode
    3619450
  • Title

    Efficient Parameter Extraction and Statistical Analysis for a 0.25um low-power CMOS Process

  • Author

    E.V. Saavedra Diaz;K.G. McCarthy;D.B.M. Klaassen;A. Mathewson

  • Author_Institution
    National Microelectronics Research Centre, Cork, Ireland
  • fYear
    1997
  • fDate
    6/19/1905 12:00:00 AM
  • Firstpage
    656
  • Lastpage
    659
  • Keywords
    "Parameter extraction","Statistical analysis","CMOS process","Current measurement","Semiconductor device modeling","Threshold voltage","Equations","Microelectronics","Circuit simulation","Data mining"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1997. Proceeding of the 27th European
  • Print_ISBN
    2-86332-221-4
  • Type

    conf

  • DOI
    10.1109/ESSDERC.1997.194514
  • Filename
    1503444
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619450