• DocumentCode
    3619482
  • Title

    Impact of constant current stressing procedure on Stress Induced Leakage current generation in thin oxides

  • Author

    P. Riess;G. Ghibaudo;G. Pananakakis;J. Brini;G. Ghidini

  • Author_Institution
    LPCS/ENSERG/INPG, Grenoble, France
  • fYear
    1998
  • fDate
    6/20/1905 12:00:00 AM
  • Firstpage
    544
  • Lastpage
    547
  • Keywords
    "Leakage current","Delay effects","Stress measurement","Time measurement","Electrons","Carbon capture and storage","Microelectronics","CMOS technology","Current measurement","Thickness measurement"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1998. Proceeding of the 28th European
  • Print_ISBN
    2-86332-234-6
  • Type

    conf

  • Filename
    1503609
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619482