DocumentCode
3619494
Title
Robust Design of Threshold Logic Circuits Using Neuron MOS Transistors
Author
A. Luck;R. Thewes;K. Goser;W. Weber
Author_Institution
Siemens AG, Munich, Germany
fYear
1998
fDate
6/20/1905 12:00:00 AM
Firstpage
592
Lastpage
595
Keywords
"Robustness","Logic circuits","Neurons","MOSFETs","Capacitance","Logic devices","Equations","Logic design","Threshold voltage","Logic gates"
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Print_ISBN
2-86332-234-6
Type
conf
Filename
1503621
Link To Document