DocumentCode :
3619497
Title :
Low Frequency Noise Measurements at Elevated Temperatures on Thin-Film SOI n-MOSFET
Author :
V. Dessard;D. Flandre
Author_Institution :
Univ. Catholique de Louvain, Louvain-la-Neuve, Belgium
fYear :
1998
fDate :
6/20/1905 12:00:00 AM
Firstpage :
604
Lastpage :
607
Keywords :
"Temperature measurement","Low-frequency noise","Frequency measurement","Noise measurement","Transistors","MOSFET circuits","Voltage","Noise figure","Performance evaluation","Additive noise"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Print_ISBN :
2-86332-234-6
Type :
conf
DOI :
10.1109/HTEMDS.1998.730657
Filename :
1503624
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619497
