• DocumentCode
    3619499
  • Title

    Interface Properties of TiN(x)/n-Si Schottky Contacts Investigated by Low Frequency Noise Measurements

  • Author

    C.A. Dimitriadis;G. Kamarinos;S. Logothetidis;F.V. Farmakis;J. Brini;N. Mathieu

  • Author_Institution
    University of Thessaloniki, Greece
  • fYear
    1998
  • fDate
    6/20/1905 12:00:00 AM
  • Firstpage
    612
  • Lastpage
    615
  • Keywords
    "Schottky barriers","Low-frequency noise","Frequency measurement","Noise measurement","Schottky diodes","Semiconductor diodes","Semiconductor films","Contacts","Tin","Semiconductor device noise"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1998. Proceeding of the 28th European
  • Print_ISBN
    2-86332-234-6
  • Type

    conf

  • Filename
    1503626
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619499