• DocumentCode
    3619520
  • Title

    Water-Assisted Positive Ion Contamination Resulting in Charge Loss in Nonvolatile Memories

  • Author

    P. Gassot;A. Iline;E. De Backer;M. Tack;D. Wellekens;J. Van Houdt;L. Haspeslagh

  • Author_Institution
    Alcatel Microelectronics, Oudenaarde, Belgium
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    268
  • Lastpage
    271
  • Keywords
    "Contamination","Nonvolatile memory","Silicon compounds","Passivation","CMOS technology","Threshold voltage","Temperature","CMOS process","Tin","Microelectronics"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194766
  • Filename
    1503696
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619520