DocumentCode :
3619527
Title :
RF Distortion Characterisation of Sub-Micron CMOS
Author :
L.F. Tiemeijer;R. van Langevelde;O. Gaillard;R.J. Havens;P.G.M. Baltus;P.H. Woerlee;D.B.M. Klaassen
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
fYear :
2000
fDate :
6/22/1905 12:00:00 AM
Firstpage :
464
Lastpage :
467
Keywords :
"Radio frequency","Linearity","CMOS technology","Semiconductor device modeling","Distortion measurement","Energy consumption","Current measurement","Power measurement","Charge carrier processes","Harmonic analysis"
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
Type :
conf
DOI :
10.1109/ESSDERC.2000.194815
Filename :
1503745
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3619527
