• DocumentCode
    3619532
  • Title

    Determination of the Recombination Lifetime in the Space Charge Region of MOS Field-Induced PN Junctions

  • Author

    R. Sorge;B. Heinemann;J. Grabmeier;G. Obermeier;H. Richter

  • Author_Institution
    IHP, Frankfurt (Oder), Germany
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    484
  • Lastpage
    487
  • Keywords
    "Space charge","Pollution measurement","Current measurement","Capacitance measurement","Frequency measurement","Current-voltage characteristics","Voltage","Contamination","Energy states","Energy measurement"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194820
  • Filename
    1503750
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619532