• DocumentCode
    3619547
  • Title

    Study of Hot-spot Phenomena in Cellular Power Transistors by Analytical Electro-Thermal Simulation

  • Author

    P.E. Bagnoli;S. Di Pascoli;G. Breglio

  • Author_Institution
    University of Pisa, Italy
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    547
  • Lastpage
    550
  • Keywords
    "Power transistors","Analytical models","Thermal resistance","Thermal conductivity","Steady-state","Power engineering and energy","Information analysis","Temperature distribution","Computational modeling","Packaging"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
  • Print_ISBN
    88-900847-8-2
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2002.194989
  • Filename
    1503919
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619547