• DocumentCode
    3619552
  • Title

    Effect of Pulsed Stress on Leakage Current In MOS Capacitors For Non-Volatile Memory Applications

  • Author

    D. Caputo;R. Feruglio;F. Irrera;B. Ricco

  • Author_Institution
    University of Rome "La Sapienza", Italy
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    567
  • Lastpage
    570
  • Keywords
    "Stress","Leakage current","MOS capacitors","Nonvolatile memory"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
  • Print_ISBN
    88-900847-8-2
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2002.194994
  • Filename
    1503924
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3619552