• DocumentCode
    3619565
  • Title

    Microwave noise Modeling of the 0.18um Gate Length Mosfets with a 60GHz Cut-off Frequency

  • Author

    P. Sakalas;A. Litwin;H. Zirath;M. Schroter

  • Author_Institution
    Dresden University of Technology, Germany
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    619
  • Lastpage
    622
  • Keywords
    "MOSFETs","Cutoff frequency","Semiconductor device noise","Radio frequency","Circuit noise","Fingers","Equivalent circuits","Substrates","Noise measurement","Testing"
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
  • Print_ISBN
    88-900847-8-2
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2002.195007
  • Filename
    1503937